| Issue |
EPJ Web Conf.
Volume 132, 2017
XXV-th Congress on Spectroscopy
|
|
|---|---|---|
| Article Number | 03006 | |
| Number of page(s) | 2 | |
| Section | Poster talks | |
| DOI | https://doi.org/10.1051/epjconf/201713203006 | |
| Published online | 13 December 2016 | |
https://doi.org/10.1051/epjconf/201713203006
Near-field polarization distribution of Si nanoparticles near substrate
1 International Laser Center and Faculty of Physics, Lomonosov Moscow State University, 119991 Moscow, Russia
2 Kolmogorov School, Lomonosov Moscow State University, 119991 Moscow, Russia
3 Institute for Spectroscopy RAS, 108840 Troitsk, Moscow, Russia
* Corresponding author: yu.vladimirova@physics.msu.ru
Published online: 13 December 2016
Structure of the near-field intensity and polarization distributions, the latter is described with the generalized 3D Stokes parameters, of a spherical Si subwavelength nanoparticle in a non-magnetic and non-absorbing media near a dielectric substrate has been studied in detail with the help of the Mie theory and an extension of the Weyl's method for the calculation of the reflection of dipole radiation by a flat surface. It is shown that for the nanoparticle near the substrate the interference effects due to the scattering by the nanoparticle and interaction with the substrate play an essential role. We also demonstrate how these effects depend on the dielectric properties of the nanoparticle, its size, distance to the substrate as well as on the polarization, wavelength and incident angle of the external light field.
© The Authors, published by EDP Sciences, 2017
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