EPJ Web Conf.
Volume 161, 2017XI International Symposium on Photon Echo and Coherent Spectroscopy (PECS-2017)
|Number of page(s)||2|
|Published online||31 October 2017|
Data processing approaches in adopting single point–like emitter spectromicroscopy for mapping material characteristics of solid media
Institute for Spectroscopy RAS, 108840, Troitsk, Moscow, Russia
2 Moscow State Pedagogical University, 119991 Moscow Russia
* Corresponding author: firstname.lastname@example.org
Published online: 31 October 2017
We report an algorithm for building topogram of dielectric properties of a thin film by data of spectromicroscopy of single emitters.
© The Authors, published by EDP Sciences, 2017
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (http://creativecommons.org/licenses/by/4.0/).
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