Investigation of AWG demultiplexer based SOI for CWDM application

¹ School of Microelectronic Engineering, Universiti Malaysia Perlis (UniMAP), 02600 Arau, Perlis
² Institute of Microengineering Nanoelectronics (IMEN), Universiti Kebangsaan Malaysia (UKM), 43600 UKM Bangi, Selangor, Malaysia

^* Corresponding author: nurjuliana@unimap.edu.my

Published online: 22 November 2017

Abstract

9-channel Arrayed Waveguide Grating (AWG) demultiplexer for conventional and tapered structure were simulated using beam propagation method (BPM) with channel spacing of 20 nm. The AWG demultiplexer was design using high refractive index (n~3.47) material namely silicon-on-insulator (SOI) with rib waveguide structure. The characteristics of insertion loss, adjacent crosstalk and output spectrum response at central wavelength of 1.55 μm for both designs were compared and analyzed. The conventional AWG produced a minimum insertion loss of 6.64 dB whereas the tapered AWG design reduced the insertion loss by 2.66 dB. The lowest adjacent crosstalk value of -16.96 dB was obtained in the conventional AWG design and this was much smaller compared to the tapered AWG design where the lowest crosstalk value is -17.23 dB. Hence, a tapered AWG design significantly reduces the insertion loss but has a slightly higher adjacent crosstalk compared to the conventional AWG design. On the other hand, the output spectrum responses that are obtained from both designs were close to the Coarse Wavelength Division Multiplexing (CWDM) wavelength grid.