EPJ Web Conf.
Volume 205, 2019XXI International Conference on Ultrafast Phenomena 2018 (UP 2018)
|Number of page(s)||3|
|Section||High Harmonic Generation and Attosecond Science|
|Published online||16 April 2019|
Broadband extreme ultraviolet interferometry and imaging
1 Advanced Research Center for Nanolithography, Science Park 110, 1098 XG Amsterdam, The Netherlands
2 Department of Physics and Astronomy, and Laserlab, Vrije Universiteit, De Boelelaan 1081 HV Amsterdam, The Netherlands
* Corresponding author: email@example.com
Published online: 16 April 2019
Using a pair of phase-locked high-harmonic generation sources, we demonstrate Fourier transform interferometry at extreme-ultraviolet (EUV) wavelengths between 17 and 55 nm. This is made possible by the adaptation of a birefringence-based ultrastable interferometer for infrared femtosecond pulses. Since we measure the interference with an EUV-sensitive CCD camera, this enables a wide range of spatially and spectrally resolved measurements at extreme ultraviolet wavelengths. We demonstrate the capabilities of this technique by performing wavelength-resolved high-resolution coherent diffractive imaging and by measuring the spatially resolved spectral absorption of a thin structured titanium film.
© The Authors, published by EDP Sciences, 2019
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.