| Issue |
EPJ Web Conf.
Volume 215, 2019
EOS Optical Technologies
|
|
|---|---|---|
| Article Number | 08003 | |
| Number of page(s) | 2 | |
| Section | Joint Session (EOS MOS and SPIE OM) – Measurement of Optical Components I: Asphere and Freeform Measurement, EOS Papers only | |
| DOI | https://doi.org/10.1051/epjconf/201921508003 | |
| Published online | 10 September 2019 | |
https://doi.org/10.1051/epjconf/201921508003
Investigation of Non-Uniformity of Classically-Polished Fused Silica Surfaces via Laser-Induced Breakdown Spectroscopy
1
University of Applied Sciences and Arts, Faculty of Natural Sciences and Technology, 37085 Göttingen, Germany
2
Aix-Marseille University, CNRS, LP3, 13009 Marseille, France
* Corresponding author: christoph.gerhard@hawk.de
Published online: 10 September 2019
In this contribution, the surface uniformity of classically-manufactured fused silica windows was investigated via laser-induced breakdown spectroscopy. It is shown that for all investigated samples a comparatively high aluminium content was found at the edge of the surface with respect to its centre. This contamination can be attributed to residues from lapping and polishing agents and leads to a mentionable non-uniformity of the surface in terms of chemical composition and optical properties, respectively.
© The Authors, published by EDP Sciences, 2019
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