Issue |
EPJ Web Conf.
Volume 215, 2019
EOS Optical Technologies
|
|
---|---|---|
Article Number | 12002 | |
Number of page(s) | 2 | |
Section | Optofluidics (OF) – S03: Plenary Session (Emerging Topics I) | |
DOI | https://doi.org/10.1051/epjconf/201921512002 | |
Published online | 10 September 2019 |
https://doi.org/10.1051/epjconf/201921512002
Fast and Accurate Thickness Mapping of Thin Liquid Films
1
CNR-ISASI, Istituto di Scienze Applicate e Sistemi Intelligenti «E. Caianiello» del CNR, Via Campi Flegrei 34, 80078 Pozzuoli, Napoli, Italy.
2
College of Applied Sciences, Beijing University of Technology, 100124 Beijing, China.
3
Dipartimento di Ingegneria Chimica, dei Materiali e della Produzione Industriale, Università di Napoli Federico II, Piazzale Tecchio 80, 80125 Napoli, Italy.
* Corresponding author: z.wang@isasi.cnr.it
Published online: 10 September 2019
The thickness of thin liquid films is of great interest to industrial processes and life science. However, there are not appropriate quantitative experimental tools for an adequate study of film evolution in case of not-ideal conditions. Here, we show the application of a holographic system for the evaluation of the 3D topography and thickness of evolving protein films. We use a custom holographic microscope that combines quantitative phase imaging with materials engineering. This technique offers an unprecedented level of details and we anticipate that it will promote a deeper understanding of the underlying physics of thin film dynamics.
© The Authors, published by EDP Sciences, 2019
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