EPJ Web Conf.
Volume 238, 2020EOS Annual Meeting (EOSAM 2020)
|Number of page(s)||2|
|Section||Topical Meeting (TOM) 6- Frontiers in Optical Metrology|
|Published online||20 August 2020|
An optical metrology system for the measurement of the refractive index of glass
1 Instituto de Astrofísica e Ciências do Espaço, Universidade de Lisboa, Campo Grande 1749-016 Lisboa Portugal
2 Faculdade de Ciências da Universidade de Lisboa, Departamento de Física, Campo Grande 1749-016 Lisboa Portugal
* Corresponding author: firstname.lastname@example.org
Published online: 20 August 2020
The measurement of the refractive index of parallel plated, optically simple, glass samples is a common and fundamental activity in numerous fields of expertise. This work aimed to optimize a known technique to a simple, cost-effective and reliable system to be implemented in a lab environment, with an accuracy in the results better than 10-2. A setup with a 632.8nm HeNe laser, automatic stage and CMOS camera was used and data was acquired with the help of LabVIEW controlling software. All system components were carefully controlled and optimized with the help of an uncertainty budget. Measurements had an associated uncertainty in the range from 10-3 to 10-4.
© The Authors, published by EDP Sciences, 2020
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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