EPJ Web Conf.
Volume 238, 2020EOS Annual Meeting (EOSAM 2020)
|Number of page(s)||2|
|Section||Topical Meeting (TOM) 7- Organic & Hybrid Semiconductor Materials and Devices|
|Published online||20 August 2020|
A new route for high quality nanometric films of inorganic halide perovskites
1 Department of Physics and Astronomy, University of Florence, via G. Sansone 1, I-50019 Sesto Fiorentino (FI), Italy
2 DIEF-Industrial Engineering Department, University of Florence, via S. Marta 3, I-50139 Florence, Italy
3 INSTM-Interuniversity National Consortium for Material Science and Technology, via Giusti 9, I-50121 Florence, Italy
4 Department of Information Engineering, University of Brescia, via Branze, 38, I-25123 Brescia, Italy
5 LENS-European Laboratory for Non-Linear Spectroscopy, via Nello Carrara 1, I-50019 Sesto Fiorentino (FI), Italy
6 Department of Civil, Environmental and Mechanical Engineering, University of Trento, via Mesiano 77, I-38123 Trento, Italy
7 INFN-Firenze, via G. Sansone 1, I-50019 Sesto Fiorentino (FI), Italy
* Corresponding author: email@example.com
Published online: 20 August 2020
Successful deposition of CsPbX3 (X = Br, Cl) thin films (50-500 nm) on several kind of substrates has been realized by Radio-Frequency Magnetron Sputtering. The technique allows for high homogeneity of the samples on large areas (several cm2) not only in terms of morphology but also referring to the optical properties. In particular, high resolution (in space, spectrum and time) photoluminescence studies in a wide temperature range (10-300 K) reveal that the low inhomogeneous broadening comes from a submicron size disorder while no significant contribution arises from a micrometric or even larger disorder. Given the relevance of inorganic halide perovskites for innovative optoelectronic devices, our results prove the scalability of this technique. Moreover, the successful deposition on several different substrates open the route for an easy integration in multi-layered structures.
© The Authors, published by EDP Sciences, 2020
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