| Issue |
EPJ Web Conf.
Volume 261, 2022
Applied Nuclear Physics Conference (ANPC 2021)
|
|
|---|---|---|
| Article Number | 01006 | |
| Number of page(s) | 4 | |
| Section | Ion Beam Analytical Methods in Material Science | |
| DOI | https://doi.org/10.1051/epjconf/202226101006 | |
| Published online | 11 April 2022 | |
https://doi.org/10.1051/epjconf/202226101006
Enhanced thin film analysis via High Resolution RBS using the NEC CARBS system
1
National Electrostatics Corp. 7540 Graber Rd, Middleton, WI 53562, USA
2
Max Planck Institute of Microstructure Physics, Weinberg 2, D-06120, Halle Saale, Germany
* Corresponding author: pollock@pelletron.com
Published online: 11 April 2022
Advancements in thin film deposition techniques can now produce films of only a few monolayers in thicknesses, with multiple applications emerging in the nano technology field. This maturing manufacturing technique is driving the need for diagnostics tools able to accurately measure depth profiles. To meet this need, the Compact Automated Rutherford Back-Scattering (CARBS) system is under development at National Electrostatics Corp. (NEC) for nanometer thin film analysis using High-resolution RBS (HRBS) within a 4 x 4meter footprint. We present the recent development of the system and demonstrate a study of HRBS applied to a 30nm CoAl alloy film. We compare the performance of the CARBS system with the conventional NEC HRBS end station and discuss the advantages of HRBS over SIMS method.
© The Authors, published by EDP Sciences, 2022
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