| Issue |
EPJ Web Conf.
Volume 309, 2024
EOS Annual Meeting (EOSAM 2024)
|
|
|---|---|---|
| Article Number | 02006 | |
| Number of page(s) | 2 | |
| Section | Topical Meeting (TOM) 2- Frontiers in Optical Metrology | |
| DOI | https://doi.org/10.1051/epjconf/202430902006 | |
| Published online | 31 October 2024 | |
https://doi.org/10.1051/epjconf/202430902006
Correction of phase drifts in two-wavelength digital holographic microscopy using secondary reference waves
Institute of Scientific Instruments of the Czech Academy of Sciences, Královopolská 147, 612 00 Brno, Czech Republic
* Corresponding author: martins@isibrno.cz
Published online: 31 October 2024
We present a two-wavelength digital holographic microscopy setup for surface topography measurement with single-point illumination and a method for correction of unwanted phase drifts using secondary reference waves.
© The Authors, published by EDP Sciences, 2024
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