| Issue |
EPJ Web Conf.
Volume 309, 2024
EOS Annual Meeting (EOSAM 2024)
|
|
|---|---|---|
| Article Number | 06021 | |
| Number of page(s) | 2 | |
| Section | Topical Meeting (TOM) 6- Optical Materials | |
| DOI | https://doi.org/10.1051/epjconf/202430906021 | |
| Published online | 31 October 2024 | |
https://doi.org/10.1051/epjconf/202430906021
Study of the defect in the CaF2 materials via a laser-induced fluorescence measurement
1 Regional Center for Special Optics and Optoelectronic Systems (TOPTEC), Institute of Plasma Physics of the Czech Academy of Sciences, Za Slovankou 1782/3, 182 00 Prague 8-Liben, Czech Republic
2 Institute of Macromolecular Chemistry, Academy of Sciences of the Czech Republic, 162 06 Prague 6, Czech Republic
* Corresponding author: guesmi@ipp.cas.cz
Published online: 31 October 2024
Analysis of defects in optical materials is crucial for their applicability in cutting-edge optical components. Since calcium fluoride (CaF2) is highly regarded for optical applications, understanding the nature of defects within CaF2 is particularly significant. These defects have been conventionally identified through absorption and photoluminescence (PL) emission studies. In this work, we investigate the defects by measuring laser-induced fluorescence (LIF) spectra over a long irradiation. By decomposing the PL spectrum into multiple Gaussian PL bands, we identify the defects within the CaF2 material. The measurement of irradiation-induced PL can be rationalized by the stabilization of F-centers via the formation of M-centers. PL mapping has been also studied to study the potential link between the surface oxygen contamination of CaF2 samples and polishing techniques.
© The Authors, published by EDP Sciences, 2024
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