| Issue |
EPJ Web Conf.
Volume 323, 2025
22nd International Metrology Congress (CIM2025)
|
|
|---|---|---|
| Article Number | 12001 | |
| Number of page(s) | 5 | |
| Section | Electromagnetism | |
| DOI | https://doi.org/10.1051/epjconf/202532312001 | |
| Published online | 07 April 2025 | |
https://doi.org/10.1051/epjconf/202532312001
Electric field probe calibration method by using a TEM cell for reference field generation
Laboratoire National de métrologie et d’essais LNE, HF Metrology Department, 78197 Trappes, France
* Corresponding author: seif.benhassine@lne.fr
Published online: 7 April 2025
The article presents a method to calibrate electric field probes using a transverse electromagnetic (TEM) cell as a reference. The TEM cell generates uniform and repeatable fields for accurate calibration. The process and setup are carefully detailed to ensure precise generation and measurement. We perform a full uncertainty analysis, considering factors like power delivery, septum-to-wall distance, impedance mismatch, and field inhomogeneity. The total uncertainty of the calibration is 10 % of the electric field amplitude, ensuring good accuracy. To validate the method, measurements are compared with data from an accredited laboratory over a frequency range of 9 kHz to 300 MHz. The results show excellent agreement, with errors within acceptable limits. This confirms the reliability and robustness of the method. The proposed approach provides a reliable solution for accurate electric field probe calibration.
© The Authors, published by EDP Sciences, 2025
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