Open Access
EPJ Web of Conferences
Volume 24, 2012
Environmental Radioactivity 2010
Article Number 07008
Number of page(s) 9
Section New Analytical Technologies
Published online 04 April 2012
  1. J. Mengali, E. Paskell, R. W. Beck, and C. S. Peet, Proceedings of the Second Conference on Nuclear Radiation Effects on Semiconductor Devices, Materials and Circuits, Sept. 1959. [Google Scholar]
  2. John M. Swartz and Marlin O. Thurston, Analysis of the Effect of Fast-Neutron Bombardment on the Current-Voltage Characteristic of a Conductivity-Modulated p-i-n Diode, Journal of Applied Physics 37 (1966) 745–754. [CrossRef] [Google Scholar]
  3. R. Korde, A. Ojha et al., The effect of neutron irradiation on silicon photodiodes, IEEE Transactions on Nuclear Science 36 (1989) 2169–2175. [Google Scholar]
  4. A.B. Rosenfeld et al, PIN diode with a wide measurement range of fast neutron doses, Radiation Protection Dosimetry 33 (1990) 75–178. [Google Scholar]
  5. Dante M. Tasca, Pulse modes in failure power semiconductor, IEEE Transactions on Nuclear Science 17 (1970) 364–372. [CrossRef] [Google Scholar]
  6. Ravotti T., et al., “BPW34 commercial p-i-n diodes for high-level 1 MeV neutron equivalent fluence monitoring”, in 9th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2007, 10–14 September 2007. [Google Scholar]
  7. [Google Scholar]

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