Open Access
Issue
EPJ Web of Conferences
Volume 33, 2012
2nd European Energy Conference
Article Number 02004
Number of page(s) 8
Section Sciences for Energy
DOI https://doi.org/10.1051/epjconf/20123302004
Published online 02 October 2012
  1. F. Cerdeira, I. Torriani, P. Motisuke, V. Lemos, and F. Decker, Appl Phys A 46, 107–112 (1988) [CrossRef] [Google Scholar]
  2. G. Hodes, J. Manassen, and D. Cahen, J Am Chem Soc 102, 5962–5964 (1980) [CrossRef] [Google Scholar]
  3. C.M.T Gutierrez and J. Ortega, J Electrochem Soc 136, 2316–2320 (1989) [CrossRef] [Google Scholar]
  4. D.L. Klein, R. Roth, K.L.A Lim, A.P. Alivisatos, and P.L. McEuen Nature 389, 699–701 (1997) [CrossRef] [Google Scholar]
  5. K.R. Murali, V. Swaminathan, and D.C. Trivedi, Sol Energ Mat Sol C 81, 113–118 (2004) [CrossRef] [Google Scholar]
  6. A.C. Jones, Chem Soc Rev 26, 101–110 (1997) [CrossRef] [Google Scholar]
  7. Z. Aneva, D. Nesheva, C. Main, S. Reynolds, A.G. Fitzgerald and E. Vateva, Semicond Sci Technol 23 art. no. 095002 (2008) [CrossRef] [Google Scholar]
  8. P.P. Hankare, V.M. Bhuse, K.M. Garadkar, S.D. Delekar and I.S. Mulla, Semicond Sci Technol 19, 70–75 (2004) [CrossRef] [Google Scholar]
  9. D.R. Pratt, M.E. Langmuir, R.A. Boudreau, and R.D. Rauh, J Electrochem Soc 128,1627–1629 (1981) [CrossRef] [Google Scholar]
  10. K. Rajeshwar, L. Thompson, P. Single, R.C. Kainthla, K.L. Chopra, J Electrochem Soc 128, 1744–1750 (1981) [CrossRef] [Google Scholar]
  11. R.A. Boudreau and R.D. Rauch , J Electrochem Soc 130, 513–516 (1983) [CrossRef] [Google Scholar]
  12. G. Hodes, E. Grunbaum, Y. Feldman, S. Bastide, and C. Lévy-Clément, J Electrochem Soc 152(12), G917–G923 (2005) [CrossRef] [Google Scholar]
  13. M.S. Kazacos, M. Skyllas, and B. Miller, J Electrochem Soc 127, 2378–2381 (1981) [CrossRef] [Google Scholar]
  14. G. Hodes, A. Albu-Yaron, A. Decker, and P. Motisuke, Phys Rev B 36, 4215–4221 (1987) [Google Scholar]
  15. T.G. Argyropoulos, J. Novakovic, M.D. Athanassopoulou, P. Vassiliou, J.A. Mergos, C.T. Dervos, Defect and Diffusion Forum 297–301, 912–917(2010) [Google Scholar]
  16. D. Lincot, Thin Solid Films 487, 40–48 (2005) [CrossRef] [Google Scholar]
  17. S. Nagata and K. Agata, J Phys Soc Jpn 6, 523–524 (1951) [CrossRef] [Google Scholar]
  18. I.P. Kalinkin, L.A. Srgeeva, V.A. Aleskovskii, and L.P. Strakhov, Krystallografiya 8, 459 (1963) [Google Scholar]
  19. C.R. Martin, Science 266, 1961–1966 (1994) [CrossRef] [PubMed] [Google Scholar]
  20. A. Huczko, Appl Phys A 70, 365–376 (2000) [CrossRef] [Google Scholar]
  21. E.H. Rhoderick, Metal semiconductor contacts. (Oxford SP1980) [Google Scholar]
  22. K.R. Murali, I. Radhakrishna, K. Nagaraja Rao and V.K. Venkatesan, J Mater Sci 25, 3521–3523 (1990) [CrossRef] [Google Scholar]
  23. C.T. Dervos, P.D. Skafidas, J.A. Mergos, and P. Vassiliou, Sensors 4, 58–70 (2004) [CrossRef] [Google Scholar]

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.