Open Access
EPJ Web Conf.
Volume 162, 2017
International Conference on Applied Photonics and Electronics 2017 (InCAPE2017)
Article Number 01047
Number of page(s) 5
Published online 22 November 2017
  1. W. R. Frensley and N. G. Einspruch, VLSI Electronics: Microstructure Science (San Diego: Academic Press, 1995). [Google Scholar]
  2. G. C. Osbourn, J. App.Phy., 53, pp. 1586–1589 (1982). [CrossRef] [Google Scholar]
  3. G. Bauer and F. Schaffler, Physica Status Solidi(a), 203, pp. 3496–3505 (2006). [CrossRef] [Google Scholar]
  4. T. F. Kuech, et al.,IEEE In. Con. IPRM 09 pp. 6364 (2009). [Google Scholar]
  5. E. Carey and S. Lidholm,Millimeter-Wave Integrated Circuits (Boston, Springer Science, 2005). [Google Scholar]
  6. F.V. Seggern, I. Keskin, E. Koos, R. Kruk, H. Hahn and S. Dasgupta, ACS Appl. Mater. Interfaces, 8, pp. 31757 (2016). [CrossRef] [Google Scholar]
  7. B. Nasr Zhirong Z. Arger, D. Wang, R. Kruk, H. Hahn and S. Dasgupta, J. Mater. Chem. C, 1, 2548–2552 (2013). [CrossRef] [Google Scholar]
  8. F. Ootsuka; A. Katakami; K. Shirai; T.Watanabe; H. Nakata; M. Kitajima; T. Aoyama; T. Eimori; Y. Nara; Y. Ohji and M. Tanjyo, IEEE Trans. on Elect. Dev., 55 (2008). [Google Scholar]
  9. M. Mohamad Isa, N. Ahmad, F. Packeer, M., J. Eng. Tech., (2015). [Google Scholar]
  10. M. Mohamad Isa et. al, Proc. ICED 2016 (2016). [Google Scholar]
  11. S. Fujita et al., J. of App Phy., 73, pp. 1284–1287 (1993). [CrossRef] [Google Scholar]
  12. D. K. Schroder, Semiconductor Material and Device Characterization, John Wiley & Sons, New Jersey, (2006). [Google Scholar]
  13. S. R. Bahl, et al., Electron Devices, IEEE Transactions, 39, pp. 2037–2043 (1992). [CrossRef] [Google Scholar]
  14. S.R. Bahl and I. A. del Alamo, Electron Device Letters, IEEE, 13, pp. 195–197 (1992) [CrossRef] [Google Scholar]
  15. S. R. Bahl and J. A. d. Alamo, Proc. 2nd Int. Conf. IPRM., (1990). [Google Scholar]

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