Open Access
Issue
EPJ Web Conf.
Volume 205, 2019
XXI International Conference on Ultrafast Phenomena 2018 (UP 2018)
Article Number 08015
Number of page(s) 3
Section Ultrafast Electron Microscopy
DOI https://doi.org/10.1051/epjconf/201920508015
Published online 16 April 2019
  1. T. van Oudheusden, P. L. E. M. Pasmans, S. B. van der Geer, M. J. de Loos, M. J. van der Wiel, and O. J. Luiten. “Compression of subrelativistic space-charge-dominated electron bunches for single-shot femtosecond electron diffraction”. Phys. Rev. Lett., 105, 264801, (2010). [CrossRef] [PubMed] [Google Scholar]
  2. M. R. Otto, L. P. Ren de Cotret, M. J. Stern, and B. J. Siwick. “Solving the jitter problem in microwave compressed ultrafast electron diffraction instruments: Robust sub-50 fs cavity-laser phase stabilization”. Struc. Dyn., 4:5, 051101, (2017) and references therein. [CrossRef] [Google Scholar]
  3. G. H. Kassier, K. Haupt, N. Erasmus, E. G. Rohwer, H. M. von Bergmann, H. Schwoerer, S. M. M. Coelho, and F. D. Auret. “A compact streak camera for 150 fs time resolved measurement of bright pulses in ultrafast electron diffraction”. Rev. Sci. Inst., 82, 105103, (2010). [CrossRef] [PubMed] [Google Scholar]
  4. Robert P. Chatelain, Vance R. Morrison, Chris Godbout, and Bradley J. Siwick. “Ultrafast electron diffraction with radio-frequency compressed electron pulses”. Appl. Phys. Lett., 101, 081901, (2012). [Google Scholar]

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