Open Access
EPJ Web Conf.
Volume 215, 2019
EOS Optical Technologies
Article Number 09005
Number of page(s) 2
Section Joint Session (EOS MOS and SPIE OM) – Manufacturing, Tolerancing and Testing of Optical Systems (MOS) POSTERS
Published online 10 September 2019
  1. S. Mobilio, F. Boscherini, C. Meneghini, synchrotron radiation: Basics, methods and applications (Springer-Verlag Berlin Heidelberg, 2015) [Google Scholar]
  2. K. Yamauchi, K. Yamamura; H. Mimura, Y. Sano, ; S. Matsuyama, H. Yumoto, K. Ueno, M. Shibahara, K. Endo, M. Yabashi, K. Tamasaku, Y. Nishino, T. Ishikawa, Y. Mori, Proc SPIE, 5533 :116 (2004) [CrossRef] [Google Scholar]

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