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Enhanced thin film analysis via High Resolution RBS using the NEC CARBS system

Thomas Pollock, Eric Alderson, Kevin Berk, Levon McQuown, Ilya Kostanovskiy, Peng Wang, Dmitry Knyazev and Stuart S. P. Parkin

EPJ Web Conf., 261 (2022) 01006

Published online: 11 April 2022

DOI: 10.1051/epjconf/202226101006

Thomas Pollock

Eric Alderson

Kevin Berk

Levon McQuown

Ilya Kostanovskiy

Peng Wang

Dmitry Knyazev

Stuart S. P. Parkin

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Articles written by ANY OF the selected authors (OR)

eISSN: 2100-014X