EPJ Web of Conferences

Nanoscale Calibration Standards for On-Wafer S-Parameters measurements up to 110 GHz

Daouda Seck, Djamel Allal, Florent Marlec, Clément Lenoir, Mohamed Sebbache and Kamel Haddadi

EPJ Web Conf., 323 (2025) 12003

Published online: 07 April 2025

DOI: 10.1051/epjconf/202532312003

Daouda Seck

Djamel Allal

Florent Marlec

Clément Lenoir

Mohamed Sebbache

Kamel Haddadi

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