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Ellipsometry as an express method for determining the pore parameters of ion-track SiO₂ templates on a silicon substrate

Victoria Bundyukova, Egor Kaniukov, Alena Shumskaya, Andrey Smirnov, Maksim Kravchenko and Dzmitry Yakimchuk

EPJ Web Conf., 201 (2019) 01001

Published online: 04 February 2019

DOI: 10.1051/epjconf/201920101001

Victoria Bundyukova

Egor Kaniukov

Alena Shumskaya

Andrey Smirnov

Maksim Kravchenko

Dzmitry Yakimchuk

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