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A new technique for quick identification of defective region inside γ-ray detector

Biswajit Das, R. Palit, A. Kundu, P. Dey, V. Malik, S.K. Jadav, B.S. Naidu and A.T. Vazhappilly

EPJ Web Conf., 288 (2023) 10003

Published online: 21 November 2023

DOI: 10.1051/epjconf/202328810003

Biswajit Das

R. Palit

A. Kundu

P. Dey

V. Malik

S.K. Jadav

B.S. Naidu

A.T. Vazhappilly

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eISSN: 2100-014X