| Issue |
EPJ Web of Conferences
Volume 6, 2010
ICEM 14 – 14th International Conference on Experimental Mechanics
|
|
|---|---|---|
| Article Number | 37001 | |
| Number of page(s) | 8 | |
| Section | Identification from Full-field Measurements | |
| DOI | https://doi.org/10.1051/epjconf/20100637001 | |
| Published online | 10 June 2010 | |
https://doi.org/10.1051/epjconf/20100637001
Electro-elastic coupling modelling from multiple wavelengths imaging microscopy
1
Insitut FEMTO-ST, CNRS-UMR 6174 / UFC / ENSMM /
UTBM, 24 chemin de
l’Epitaphe, F25030
Besançon,
France
2
Institut Langevin / ESPCI ParisTech / CNRS UMR 7587,
Laboratoire d’Optique Physique, 10 rue Vauquelin, F-75231
Paris Cedex 05,
France
3
PECSA, CNRS-UMR 7195 / ESPCI ParisTech,
10 rue Vauquelin,
F-75231
Paris Cedex 05,
France
a e-mail: cecile.flammier@femto-st.fr
Due to their ability to interact with their environment, the interest in microcantilever sensors in biological or chemical applications is increasing. Moreover measurement of the sensor bending induced by molecular adsorption is improved by electrochemical actuation of the cantilever. This is why modelling the electro-elastic coupling is a key issue. Different methods are used to measure the bending induced by this electrochemical actuation. Among them, multiple wavelengths imaging microscopy provides full-field measurements. The local surface electrical charge density and the deformation field are obtained by decoupling wavelength-dependent and –independent contributions to the collected intensity. Based on a modelling of the electro-elastic coupling and on these full-field measurements, an identification method of the coupling parameters of the system is proposed herein.
© Owned by the authors, published by EDP Sciences, 2010
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