| Issue |
EPJ Web of Conferences
Volume 6, 2010
ICEM 14 – 14th International Conference on Experimental Mechanics
|
|
|---|---|---|
| Article Number | 40008 | |
| Number of page(s) | 8 | |
| Section | Testing at Micro and Nano-scale | |
| DOI | https://doi.org/10.1051/epjconf/20100640008 | |
| Published online | 10 June 2010 | |
https://doi.org/10.1051/epjconf/20100640008
A simple experimental procedure to quantify image noise in the context of strain measurements at the microscale using DIC and SEM images
1
Solid Mechanics Laboratory, CNRS UMR 7649, Department of
Mechanics, École polytechnique ParisTech, 91128
Palaiseau cedex,
France
2
Laboratoire Navier, École des ponts ParisTech, Université Paris
Est, Champs-sur-Marne, 77455
Marne-la-Vallée cedex 2,
France
a e-mail: heripre@lms.polytechnique.fr
Image noise is an important factor that influences the accuracy of strain field measurements by means of digital image correlation and scanning electron microscope (SEM) imaging. We propose a new model to quantify the SEM image noise, which extends the classical photon noise model by taking into account the brightness setup in SEM imaging. Furthermore, we apply this model to investigate the impact of different SEM setting parameters on image noise, such as detector, dwell time, spot size, and pressure in the SEM chamber in the context of low vacuum imaging.
© Owned by the authors, published by EDP Sciences, 2010
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