EPJ Web Conf.
Volume 238, 2020EOS Annual Meeting (EOSAM 2020)
|Number of page(s)||2|
|Section||Topical Meeting (TOM) 6- Frontiers in Optical Metrology|
|Published online||20 August 2020|
Application of the Vernier method for absolute distance metrology with CW TOF phase shift technique
1 Instituto de Astrofísica e Ciências do Espaço, Universidade de Lisboa, Campo Grande, PT1749-016 Lisboa, Portugal
2 Departamento de Física, Faculdade de Ciências, Universidade de Lisboa, Edifício C8, Campo Grande, PT1749-016 Lisbon, Portugal
Published online: 20 August 2020
A phase shift time of flight technique determines a position by comparing the phase angle of a continuously modulated signal in the source and its reflection on a target. However, due to its cyclical properties, the position information is contained within an ambiguity interval. For an absolute measurement, this interval is repeated N times plus a residual part given by the phase shift. In this work we propose an application of the Vernier method to determine N and a setup for mid-range applications (10-20) m with a 3 GHz amplitude modulated source to allow accuracies ≤ 100 μm.
© The Authors, published by EDP Sciences, 2020
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