| Issue |
EPJ Web Conf.
Volume 238, 2020
EOS Annual Meeting (EOSAM 2020)
|
|
|---|---|---|
| Article Number | 06016 | |
| Number of page(s) | 2 | |
| Section | Topical Meeting (TOM) 6- Frontiers in Optical Metrology | |
| DOI | https://doi.org/10.1051/epjconf/202023806016 | |
| Published online | 20 August 2020 | |
https://doi.org/10.1051/epjconf/202023806016
Application of the Vernier method for absolute distance metrology with CW TOF phase shift technique
1 Instituto de Astrofísica e Ciências do Espaço, Universidade de Lisboa, Campo Grande, PT1749-016 Lisboa, Portugal
2 Departamento de Física, Faculdade de Ciências, Universidade de Lisboa, Edifício C8, Campo Grande, PT1749-016 Lisbon, Portugal
* e-mail: fc48080@alunos.fc.ul.pt
** e-mail: maabreu@fc.ul.pt
*** e-mail: dmvalves@fc.ul.pt
Published online: 20 August 2020
A phase shift time of flight technique determines a position by comparing the phase angle of a continuously modulated signal in the source and its reflection on a target. However, due to its cyclical properties, the position information is contained within an ambiguity interval. For an absolute measurement, this interval is repeated N times plus a residual part given by the phase shift. In this work we propose an application of the Vernier method to determine N and a setup for mid-range applications (10-20) m with a 3 GHz amplitude modulated source to allow accuracies ≤ 100 μm.
© The Authors, published by EDP Sciences, 2020
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