| Issue |
EPJ Web Conf.
Volume 238, 2020
EOS Annual Meeting (EOSAM 2020)
|
|
|---|---|---|
| Article Number | 06018 | |
| Number of page(s) | 2 | |
| Section | Topical Meeting (TOM) 6- Frontiers in Optical Metrology | |
| DOI | https://doi.org/10.1051/epjconf/202023806018 | |
| Published online | 20 August 2020 | |
https://doi.org/10.1051/epjconf/202023806018
Fully integrated stokes snapshot imaging polarimeter
1 Friedrich Schiller University Jena, Institute of Applied Physics, 07745 Jena, Germany
2 Fraunhofer Institute of Applied Optics and Precision Engineering, Center of Excellence in Photonics, 07745 Jena, Germany
3 Fraunhofer Institute of Applied Optics and Precision Engineering, Department Optical and Mechanical System Design, 07745 Jena, Germany
4 Fraunhofer Institute of Applied Optics and Precision Engineering, Department for Microoptical Systems, 07745 Jena, Germany
* Corresponding author: carsten.stock@uni-jena.de
Published online: 20 August 2020
We present a new concept for a fully integrated nano-optical snapshot imaging polarimeter. It consists of a nano-optical retarder and polarizer array with various orientations combined with a microlens array and crosstalk module. That facilitates a fast, robust, and compact stokes imaging polarimeter without moving parts for applications at 450 nm wavelength.
© The Authors, published by EDP Sciences, 2020
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