| Issue |
EPJ Web Conf.
Volume 266, 2022
EOS Annual Meeting (EOSAM 2022)
|
|
|---|---|---|
| Article Number | 01007 | |
| Number of page(s) | 2 | |
| Section | Topical Meeting (TOM) 1- Silicon Photonics and Guided-Wave Optics | |
| DOI | https://doi.org/10.1051/epjconf/202226601007 | |
| Published online | 13 October 2022 | |
https://doi.org/10.1051/epjconf/202226601007
Bi-directional spectral broadening measurements for accurate characterisation of nonlinear hybrid integrated waveguides
1 UniversitÉ de Bordeaux, Institut d’Optique Graduate School, CNRS, Laboratoire Photonique, NumÉrique et Nanosciences, 33400 Talence, France
2 UniversitÉ Paris-Saclay, CNRS, Centre de nanosciences et de nanotechnologies (C2N), 91120 Palaiseau, France
3 UniversitÉ Paris-Saclay, Institut d’Optique Graduate School, CNRS, Laboratoire Charles Fabry, 91127 Palaiseau, France
* e-mail: mikhail.dyatlov@institutoptique.fr
Published online: 13 October 2022
The emerging interest in integrated optical technologies raises the need for precise characterisation techniques for waveguides presenting nonlinearities. Here we propose a non-interferometric measurement to accurately characterise the Kerr contribution in hybrid waveguides and illustrate its performances using SiN waveguides with a GSS chalcogenide top-layer. The sensitivity of our technique in terms of nonlinear phase reaches 10 mrad and its accuracy makes possible to extract the nonlinear contributions from the top-layer.
© The Authors, published by EDP Sciences
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