| Issue |
EPJ Web Conf.
Volume 287, 2023
EOS Annual Meeting (EOSAM 2023)
|
|
|---|---|---|
| Article Number | 04026 | |
| Number of page(s) | 2 | |
| Section | Topical Meeting (TOM) 4- Nanophotonics | |
| DOI | https://doi.org/10.1051/epjconf/202328704026 | |
| Published online | 18 October 2023 | |
https://doi.org/10.1051/epjconf/202328704026
Patterning of SiO2 interfaces for radiative cooling applications
1 School of Chemistry and Chemical Engineering, Harbin Institute of Technology, Harbin, 150001, PR China
2 European Laboratory for Non-linear Spectroscopy (LENS), University of Florence, Sesto Fiorentino, 50019, Italy
3 Center for Composite Materials and Structure, Harbin Institute of Technology, Harbin, 150001, PR China
4 Istituto Nazionale di Ricerca Metrologica (INRiM), Turin, 10135, Italy
* Corresponding author: l.pattelli@inrim.it
Published online: 18 October 2023
Silicon dioxide (SiO2) is a prominent material for radiative cooling applications due to its negligible absorption at solar wavelengths (0.25-2.5 µm) and exceptional stability. However, at thermal infrared wavelengths, its bulk phonon-polariton band introduces a strong reflection peak inside the atmospheric transparency window (8-13 µm) which is detrimental to its selective emissivity. Herein, we demonstrate scalable strategies for the patterning of ordered and disordered SiO2 metasurfaces enhancing their thermal emissivity and enabling sub-ambient passive cooling under direct sunlight.
© The Authors, published by EDP Sciences, 2023
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.