Open Access
Issue
EPJ Web of Conferences
Volume 77, 2014
16th International Congress of Metrology
Article Number 00004
Number of page(s) 4
DOI https://doi.org/10.1051/epjconf/20147700004
Published online 19 August 2014
  1. Draft Chapter 2 for SI Brochure, following redefinitions of the base units (2010); http://www.bipm.org/utils/common/pdf/si_brochure_draft_ch2.pdf
  2. Mise en pratique for the ampere and other electric units in the International System of Units (SI), CCEM/09-05, Note to the reader and Point 4, (2009); http://www.bipm.org/cc/CCEM/Allowed/26/CCEM-09-05.pdf
  3. iMERA Plus Joint Research Project “REUNIAM”, Grant Agreement No. 217257, final report (2011)
  4. J. P. Pekola, O.-P. Saira, V. F. Maisi et al., Rev. Mod. Phys. 85, 1421 (2013) [CrossRef]
  5. European Joint Research Project Quantum ampere: Realisation of the new SI ampere (Qu-Ampere, JRP number SIB07; http://www.ptb.de/emrp/868.html
  6. M. D. Blumenthal, B. Kaestner, L. Li et al., Nat. Phys. 3, 343 (2007) [CrossRef]
  7. B. Kaestner, V. Kashcheyevs, S. Amakawa et al., Phys. Rev. B 77, 153301 (2008) [CrossRef]
  8. B. Kaestner, V. Kashcheyevs, G. Hein et al., Appl. Phys. Lett. 92, 192106 (2008) [CrossRef]
  9. L. Fricke, F. Hohls, N. Ubbelohde et al., Phys. Rev. B 83, 193306 (2011) [CrossRef]
  10. S. P. Giblin, M. Kataoka, J.D. Fletcher et al., Nat. Comm. 3, 930 (2012) [CrossRef]
  11. J. P. Pekola, J. J. Vartiainen, M. Möttönen et al., Nat. Phys. 4, 120 (2008) [CrossRef]
  12. D. V. Averin, J. P. Pekola, Phys. Rev. Lett. 101, 066801 (2008) [CrossRef] [PubMed]
  13. A. Kemppinen, S. Kafanov, Y. A. Pashkin et al., Appl. Phys. Lett. 94, 172108 (2009) [CrossRef]
  14. M. Pierre, B. Roche, X. Jehl et al., in IEEE Conference Digest of the Conference on Precision Electromagnetic Measurements 2010, 755 (2010)
  15. L. Fricke, M. Wulf, B. Kaestner et al., Phys. Rev. Lett. 110, 126803 (2013) [CrossRef] [PubMed]
  16. L. Fricke, M. Wulf, B. Kaestner et al., arXiv:1312.5669v1 (2013), to be published
  17. B. Kaestner, C. Leicht, F. Hohls et al., in IEEE Conference Digest of the Conference on Precision Electromagnetic Measurements 2012 International Congress of Metrology, 706 (2012)
  18. M. Wulf, L. Fricke, F. Hohls et al., in IEEE Conference Digest of the Conference on Precision Electromagnetic Measurements 2012 International Congress of Metrology, 246 (2012)
  19. S. P. Giblin, M. Kataoka, J. Fletcher et al., in IEEE Conference Digest of the Conference on Precision Electromagnetic Measurements 2012 International Congress of Metrology, 710 (2012)
  20. V. F. Maisi, O.-P. Saira, A. Kemppinen et al., in IEEE Conference Digest of the Conference on Precision Electromagnetic Measurements 2012 International Congress of Metrology, 248 (2012)
  21. X. Jehl, B. Roche, M. Sanquer et al., in IEEE Conference Digest of the Conference on Precision Electromagnetic Measurements 2012 International Congress of Metrology, 250 (2012)
  22. M. Wulf, Phys. Rev. B 87, 035312 (2013) [CrossRef]
  23. X. Jehl, B. Voisin, T. Charron et al., Phys. Rev. X 3, 021012 (2013)
  24. X. Jehl et al., in Conference Proceedings of Métrologie 2013 International Congress of Metrology (2013)
  25. M. Götz, E. Pesel, D. Drung for publication in IEEE Conference Digest of the Conference on Precision Electromagnetic Measurements 2014 International Congress of Metrology (2014)
  26. B Steck, A. Gonzalez-Cano, N. Feltin et al., Metrologia 45, 482 (2008) [CrossRef]
  27. F. Rengnez, O. Séron, L. Devoille et al., in IEEE Conference Digest of the Conference on Precision Electromagnetic Measurements 2012 International Congress of Metrology, 150 (2012)
  28. L. Devoille, N. Feltin, B. Steck et al., Meas. Sci. Technol. 23, 124011 (2012) [CrossRef]
  29. F. Rengnez, O. Séron, L. Devoille et al., in Conference Proceedings of Métrologie 2013 International Congress of Metrology (2013)
  30. H. Scherer, S. P. Giblin, X. Jehl et al., in Conference Proceedings of Métrologie 2013 International Congress of Metrology (2013)
  31. D. Drung, C. Krause, U. Becker et al., for publication in IEEE Conference Digest of the Conference on Precision Electromagnetic Measurements 2014 International Congress of Metrology (2014)

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