Open Access
Issue
EPJ Web of Conferences
Volume 82, 2015
Thermophysical Basis of Energy Technologies
Article Number 01029
Number of page(s) 6
DOI https://doi.org/10.1051/epjconf/20158201029
Published online 20 January 2015
  1. H.J.L. Bressers, W.D. van Driel, K.M.B. Jansen, L.J. Ernst, G.Q. Zhang, Microelectronics Reliability, 47 (2007)
  2. R. Chaware, N. Vichare, P. Borgesen, D. Blass, K. Srihari, Proceedings of 2004 Surface Mount Technology Association International (2004)
  3. R.L. Torrisi, V. Maiorana, R. Nicolosi, G. Presti, Microelectronics Reliability, 52 (2012) [CrossRef]
  4. V.K. Milinchuk, O.F. Pasevich, Je.R. Klinshpont, I.P. Sheluhov, T.N. Smirnova, High Energy Chemistry, 38 (2004) [CrossRef]
  5. O. Thomas, C. Hunt, M. Wickham, Microelectronics Reliability, 52 (2012) [CrossRef]
  6. B.C. Ray, Journal of Colloid and Interface Science, 298 (2006)
  7. T.T. Mattila, Jue Li, JK Kivilahti, Microelectronics Reliability, 52 (2012) [CrossRef]
  8. K.N. Tu, Microelectronics Reliability, 51 (2011)
  9. R. Skuriat, J.F. Li, P.A. Agyakwa, N. Mattey, P. Evans, C.M. Johnson, Microelectronics Reliability, 53 (2013) [CrossRef]
  10. J.P. Ousten, Z. Khatir, Microelectronics Reliability, 51 (2011) [CrossRef]
  11. S. Ephraim, Microelectronics Reliability, 53 (2013)
  12. S.N. Zhurkov, Int J Fract Mech., 1 (4), (1965)
  13. G.V. Kuznetsov, E.V. Kravchenko, Elektromagnitnye Volny i Elektronnye Systemy, 10 (11-12), (2005)
  14. G.V. Kuznetsov, E.V. Kravchenko, Journal of Engineering Physics and Thermophysics, 80 (5), (2007) [CrossRef]
  15. E.V. Kravchenko, G.V. Kuznetsov, EPJ Web of Conferences, 76 (2014) [CrossRef] [EDP Sciences]

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.