Proton and neutron test facilities at 1 GeV synchrocyclotron of PNPI for radiation resistance testing of avionic and space electronics

Evgeniy M. Ivanov; Oleg A. Shcherbakov; Alexander S. Vorobyev; Alexei M. Gagarski; Vasili S. Anashin; Stanislav A. Artamonov; Geliy F. Mikheev

doi:10.1051/epjconf/201714603009

All issues

Volume 146 (2017)

EPJ Web Conf., 146 (2017) 03009

References

Open Access

Issue		EPJ Web Conf. Volume 146, 2017 ND 2016: International Conference on Nuclear Data for Science and Technology


Article Number		03009
Number of page(s)		4
Section		Experimental Facilities, Equipment, Techniques and Methods
DOI		https://doi.org/10.1051/epjconf/201714603009
Published online		13 September 2017

N.K. Abrosimov, L.A. Vaishnene, A.S. Vorobyev, E.M. Ivanov, G.F. Mikheev, G.A. Ryabov, M.G. Tverskoy, O.A. Shcherbakov, Instruments and Experimental Techniques 53, 469 (2010) [CrossRef] [Google Scholar]
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[1] N.K. Abrosimov, L.A. Vaishnene, A.S. Vorobyev, E.M. Ivanov, G.F. Mikheev, G.A. Ryabov, M.G. Tverskoy, O.A. Shcherbakov, Instruments and Experimental Techniques 53, 469 (2010) [CrossRef] [Google Scholar]

[2] N.K. Abrosimov, G.Z. Borukhovich, A.B. Laptev, V.V. Marchenkov, G.A. Petrov, O.A. Shcherbakov, Yu. V. Tuboltsev, V.I. Yurchenko, Nucl. Instr. Meth. A242, 121 (1985) [CrossRef] [Google Scholar]

[3] Evaluated Nuclear Data Library ENDF/B-VII.1 (2011) [Google Scholar]

[4] JENDL High Energy File 2007 (JENDL/HE-2007) [Google Scholar]

[5] JEDEC Standard JESD89A, Oct. 2006 [Google Scholar]

[6] The Ice House at Los Alamos Science Center [Google Scholar]

[7] A.V. Prokofiev, J. Blomgren, R. Nolte, S.P. Platt, S. Rottger, A.N. Smirnov, RADECS -2008 Conf. on Radiation and Its Effects on Components and Systems (Jyvaskyla, 2008) [Google Scholar]

[8] T. Nakamura, M. Baba, E. Ibe, Y. Yahagi, H. Kameyama, Terrestrial Neutron-Induced Soft Errors in Advanced Semiconductor Devices (World Scientific, Singapore, 2008) [CrossRef] [Google Scholar]

[9] E.W. Blackmore, P.E. Dodd, M.R. Shaneyfelt, IEEE Nuclear and Space Radiation Effects Conference, Radiation Effects Data Workshop (Monterey, 2003) [Google Scholar]

[10] C. Andreani, A. Pietropaolo, A. Salsano, G. Gorini, M. Tardocci, A. Paccagnella, S. Gerardin, C.D. Frost, S. Ansell, S.P. Platt, Appl. Phys. Lett. 92, 114101 (2008) [CrossRef] [Google Scholar]

[11] IEC Technical Specification TS 62396-1, May 2006 [Google Scholar]

[12] O.A. Shcherbakov, A.S. Vorobyev, A.M. Gagarski, L.A. Vaishnene, E.M. Ivanov, V.S. Anashin, L.R. Bakirov, A. E. Koziukov, IEEE Trans. Nucl. Sci. 64, XX (2016) [Google Scholar]