Open Access
Issue
EPJ Web Conf.
Volume 153, 2017
ICRS-13 & RPSD-2016, 13th International Conference on Radiation Shielding & 19th Topical Meeting of the Radiation Protection and Shielding Division of the American Nuclear Society - 2016
Article Number 06033
Number of page(s) 3
Section 6. Calculation Methods Monte Carlo & Deterministic
DOI https://doi.org/10.1051/epjconf/201715306033
Published online 25 September 2017
  1. R. Baumann, “Soft errors in advanced computer systems,” IEEE Trans. Device Mater. Rel., vol. 22, no. 3, pp. 258-266, May-Jun. 2005.
  2. T. Karnik and P. Hazucha, “Characterization of soft errors caused by single event upsets in CMOS processes,” IEEE Trans. Depend. Secure Comput., vol. 1, no. 2, pp. 128-143, Apr.-Jun. 2004. [CrossRef]
  3. R. D. Schrimpf, K. M. Warren, R. A. Weller, R. A. Reed, L. W. Massengill, M. L. Alles, D. M. Fleetwood, X. J. Zhou, L. Tsetseris, and S.T. Pantelides, “Reliability and radiation effects in IC technologies,” in Proc. IEEE Int. Reliability Physics Symp., Apr. 27-May 1 2008, pp. 97-106.
  4. F.Lei, A. Hands, S. Clucas, C. Dyer, and P. Truscott, “Improvemen tsto and validations of the QinetiQ atmospheric radiation model (QARM),” in Proc. 8th Eur. Conf. Radiation and Its Effects on Components and Systems, 2005, pp. D3-1-D3-8.
  5. F. Wrobel, F. Saigné, « MC-ORACLE: A tool for predicting Soft Error Rate », Computer Physics Communications 182 (2011), 317–321 [CrossRef]
  6. F. Wrobel, “Detailed history of recoiling ions induced by nucleons,” Computer Physics Communications, vol. 178, no. 2, pp. 88-104, Jan. 2008.
  7. Available: http://www.srim.org/SRIM
  8. B. D. Sierawski, K. M. Warren, R. A. Reed, R. A. Weller, M. M. Mendenhall, R. D. Schrimpf, R. C. Baumann, and V. Zhu, “Contribution of low energy (MeV) neutrons to upset rate in a 65 nm SRAM,” in Proc. IEEE Reliability Physics Symp., 2010, pp. 395-399.
  9. G. M. Swift, G. R. Allen, C. W. Tseng, C. Carmichael, G. Miller, and J. S. George, “Static upset characteristics of the 90 nm virtex-4QV FPGAs,” in Proc. IEEE Radiation Effects Data Workshop, 2008, pp. 98-105.

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.