EPJ Web Conf.
Volume 225, 2020ANIMMA 2019 – Advancements in Nuclear Instrumentation Measurement Methods and their Applications
|Number of page(s)||4|
|Published online||20 January 2020|
- A. Aguilar-Arevalo et al., “Measurement of radioactive contamination in the high-resistivity silicon CCDs of the DAMIC experiment,” J. Instrum., vol. 10, no. 08, pp. P08014–P08014, Aug. 2015. [Google Scholar]
- J. Estrada, J. Molina, J. J. Blostein, and G. Fernández, “Plasma effect in silicon charge coupled devices (CCDs),” Nucl. Instruments Methods Phys. Res. Sect. A Accel. Spectrometers, Detect. Assoc. Equip., vol. 665, pp. 90–93, 2011. [CrossRef] [Google Scholar]
- R. Newton, J. Dykes, M. J. Scott, and M. J. Joyce, “Alpha contamination assay, dosimetry and spectrometry using charge coupled devices,” 2016 IEEE Nucl. Sci. Symp. Med. Imaging Conf. Room-Temperature Semicond. Detect. Work. NSS/MIC/RTSD 2016, vol. 2017–Janua, 2017. [Google Scholar]
- R. Newton, M. J. Scott, and M. J. Joyce, “Investigating Artifacts Associated with beta-Particle Interactions in Charge-Coupled Devices,” … J. Mod. Phys. Conf. Ser., vol. 1, no. 1, pp. 1–5, 2010. [Google Scholar]
- G. R. Hopkinson and A. Mohammadzadeh, “Comparison of CCD Damage Due to 10- and 60-MeV Protons,” IEEE Trans. Nucl. Sci., vol. 50, no. 6 I, pp. 1960–1967, 2003. [Google Scholar]
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.