Open Access
| Issue |
EPJ Web Conf.
Volume 321, 2025
VII International Conference on Applied Physics, Information Technologies and Engineering (APITECH-VII-2025)
|
|
|---|---|---|
| Article Number | 03002 | |
| Number of page(s) | 7 | |
| Section | Quantum Physics, Optics, and Electromagnetic Phenomena | |
| DOI | https://doi.org/10.1051/epjconf/202532103002 | |
| Published online | 10 March 2025 | |
- H. Esmaeilzadeh, E. Blem, R. S. Amant, K. Sankaralingam, D. Burger, Communications of the ACM 56, 93–102 (2013) [CrossRef] [Google Scholar]
- W.-C. Chen, S.-H. Chen, G. Hellings, E. Bury, M. Simicic, Z. Wu, G. Van der Plas, G. Groeseneken, E. Beyne, Symposium on VLSI Technology, 2021, 11–12 (2021) [Google Scholar]
- J. Lienig, J. Scheible, Fundamentals of Layout Design for Electronic Circuits (Springer, 2020) [CrossRef] [Google Scholar]
- J. Ryckaert, A. Gupta, A. Jourdain, B. Chava, G. Van der Plas, D. Verkest, E. Beyne, Electron Devices Technology and Manufacturing Conference (EDTM), pp. 50–2 (2019) [CrossRef] [Google Scholar]
- A. Jourdain, M. Stucchi, G. Plas, G. Beyer, E. Beyne, IEEE 72nd Electron. Compon. Technol. Conf (ECTC), pp. 1531–1538 (2022) [Google Scholar]
- A. Gupta et al., IEEE International Electron Devices Meeting (IEDM), 22.5.1–4 (2021) [CrossRef] [Google Scholar]
- G. Sisto et al., International Interconnect Technology Conference (IITC) (2021) [Google Scholar]
- S. Choi, A. B. Kahng, M. Kim, C.-H. Park, B. Pramanik, J. Jung, D. Yoon, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 43, 1218–31 (2023) [Google Scholar]
- P. K. Jo, M. O. Hossen, X. Zhang, Y. Zhang, M. S. Bakir, IEEE 68th Electron. Compon. Technol. Conf. (ECTC), 1512–18 (2018) [Google Scholar]
- R. Chen et al., IEEE International Electron Devices Meeting (IEDM), 23.4.1–4 (2022) [Google Scholar]
- E. Beyne, A. Jourdain, G. Beyer, IEEE Symposium on VLSI Technology and Circuits (2023) [Google Scholar]
- B. Kirti, D. William, Proceedings of the Symposium on International Symposium on Physical Design (ISPD), 165–70 (2015) [Google Scholar]
- H. Oprins, J. L. R. Bohorquez, B. Vermeersch, G. Van der Plas, E. Beyne, 21st IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm), 1–7 (2022) [Google Scholar]
- Sh. Lyu, T. Beechem, T. Wei, IEEE 74th Electron. Compon. Technol. Conf. (ECTC), 834–41 (2024) [Google Scholar]
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