Open Access
| Issue |
EPJ Web Conf.
Volume 323, 2025
22nd International Metrology Congress (CIM2025)
|
|
|---|---|---|
| Article Number | 12003 | |
| Number of page(s) | 4 | |
| Section | Electromagnetism | |
| DOI | https://doi.org/10.1051/epjconf/202532312003 | |
| Published online | 07 April 2025 | |
- H. Happy et al., “Measurement Techniques for RF Nanoelectronic Devices: New Equipment to Overcome the Problems of Impedance and Scale Mismatch,” in IEEE Microwave Magazine, vol. 15, no. 1, pp. 30–39, Jan.-Feb. 2014. [Google Scholar]
- K. Daffé, G et al., “On-Wafer Series-Through Broadband Measurement of Sub-fF55-nm MOS RF Voltage-Tunable Capacitors,” in IEEE Microwave and Wireless Components Letters, vol. 28, no. 9, pp. 831–833, Sept. 2018. [Google Scholar]
- R. Romano, F. Mubarak, M. Spirito and L. Galatro, “The HΓ-VNA, an Interferometric Approach for the Accurate Measurement of Extreme Impedances,” 93rd ARFTG Microwave Measurement Conference (ARFTG), Boston, MA, USA, 2019, pp. 1–6. [Google Scholar]
- K. Haddadi et al., “Multiport Vector Network Analyzer Configured in RF Interferometric Mode for Reference Impedance Renormalization,” IEEE MTT-S International Microwave Symposium (IMS), Boston, MA, USA, 2019, pp. 1276–1278. [Google Scholar]
- C. Mokhtari et al., “Nanorobotics and Automatic On-Wafer Probe Station with Nanometer Positionning Accuracy,” 2023 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO), Winnipeg, MB, Canada, 2023, pp. 22–24. [Google Scholar]
- C. Mokthari et al., “Exploring Nanorobotics Integration with Microwave and Millimeter-Wave Techniques for Advanced On-wafer Measurement,” 5th International Conference in Electronic Engineering, Information Technology & Education (EEITE), Chania, Greece, 2024, pp. 1–6. [Google Scholar]
- R. N. Simons, “Coplanar waveguide circuits, components, and systems,” John Wiley & Sons, 2004. [Google Scholar]
- Andrej Rumiantsev, “Design of On-Wafer Calibration Standards,” On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond. River Publishers, 2022. 51–67. [Google Scholar]
- D. Seck, D. Allal and K. Haddadi, “On-Wafer TRL Calibration Design for Microwave Nanoscale and High Impedance Measurement,” IEEE Symposium on Wireless Technology & Applications (ISWTA), Kuala Lumpur, Malaysia, 2024, pp. 260–263. [Google Scholar]
- M. Zeier, D. Allal, and R. Judaschke. Guidelines on the evaluation of vector network analysers (VNA). EURAMET Calibration Guide, 2018, vol. 3, no 12, p. 507–521. [Google Scholar]
- R. B. Marks and D. F. Williams, “Characteristic impedance determination using propagation constant measurement,” in IEEE Microwave and Guided Wave Letters, vol. 1, no. 6, pp. 141–143, June 1991. [Google Scholar]
- D. F. Williams and R. B. Marks, “Transmission line capacitance measurement,” in IEEE Microwave and Guided Wave Letters, vol. 1, no. 9, pp. 243–245, Sept. 1991. [Google Scholar]
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.