EDP Sciences logo
Web of Conferences logo
Search
Menu
All issues Volume 349 (2026) EPJ Web Conf., 349 (2026) 01008 References
Open Access
Issue
EPJ Web Conf.
Volume 349, 2026
18th European Workshop on Modern Developments and Applications in Microbeam Analysis (EMAS 2025)
Article Number 01008
Number of page(s) 7
DOI https://doi.org/10.1051/epjconf/202634901008
Published online 29 January 2026
  1. R. Van Grieken and A. Markowicz, editors, Handbook of X-Ray Spectrometry, 2nd ed. (CRC Press, Boca Raton, 2001). [Google Scholar]
  2. K. Tsuji, J. Injuk, and R. Van Grieken, editors, X-Ray Spectrometry: Recent Technological Advances (John Wiley & Sons, 2005). [Google Scholar]
  3. D. A. Wollman, S. W. Nam, D. E. Newbury, G. C. Hilton, K. D. Irwin, N. F. Bergren, S. Deiker, D. A. Rudman, and J. M. Martinis, Nucl. Instrum. Methods Phys. Res. Sect. Accel. Spectrometers Detect. Assoc. Equip. 444, 145 (2000). [Google Scholar]
  4. P. Hovington, V. Timoshevskii, S. Burgess, H. Demers, P. Statham, R. Gauvin, and K. Zaghib, Scanning 38, 571 (2016). [CrossRef] [PubMed] [Google Scholar]
  5. V. Polkonikov, N. Chkhalo, R. Pleshkov, A. Giglia, N. Rividi, E. Brackx, K. Le Guen, I. Ismail, and P. Jonnard, Appl. Sci. 11, 6385 (2021). [Google Scholar]
  6. K. Hassebi, E. Meltchakov, F. Delmotte, A. Giglia, and P. Jonnard, Appl. Sci. 14, 956 (2024). [Google Scholar]
  7. L. V. Azaroff, X-Ray Spectroscopy, McGraw-Hill Inc. (New York, 1974). [Google Scholar]
  8. P. Schweizer, E. Brackx, and P. Jonnard, Spectrochim. Acta Part B At. Spectrosc. 218, 106994 (2024). [Google Scholar]
  9. M. Terauchi, J. Electron Microsc. (Tokyo) 50, 101 (2001). [Google Scholar]
  10. M. Terauchi and M. Kawana, Microsc. Microanal. 8, 644 (2002). [Google Scholar]
  11. A. Erko, A. Firsov, R. Gubzhokov, A. Bjeoumikhov, A. Günther, N. Langhoff, M. Bretschneider, Y. Höhn, and R. Wedell, Opt. Express 22, 16897 (2014). [Google Scholar]
  12. K. Hassebi, N. Rividi, M. Fialin, A. Verlaguet, G. Godard, J. Probst, H. Löchel, T. Krist, C. Braig, C. Seifert, R. Benbalagh, R. Vacheresse, V. Ilakovac, K. Le Guen, and P. Jonnard, X-Ray Spectrom. 54, 76 (2025). [Google Scholar]
  13. R. v. Baltz, in Spectrosc. Dyn. Collect. Excit. Solids, edited by B. Di Bartolo and S. Kyrkos (Springer US, Boston, MA, 1997), pp. 303–338. [Google Scholar]
  14. P. Blaha, K. Schwarz, F. Tran, R. Laskowski, G. K. H. Madsen, and L. D. Marks, J. Chem. Phys. 152, 074101 (2020). [Google Scholar]
  15. CXRO X-ray interactions with matter, http://henke.lbl.gov/optical constants/. [Google Scholar]
  16. K. Hassebi, N. Rividi, O. Boudouma, M. Fialin, K. Le Guen, and P. Jonnard, X-Ray Spectrom. 54, 171 (2025). [Google Scholar]
  17. S. Rudinsky, C. M. MacRae, N. C. Wilson, H. Demers, and R. Gauvin, Microsc. Microanal. 25, 250 (2019). [Google Scholar]
  18. J.-L. Pouchou and F. Pichoir, Rech. Aérospatiale 5, 349 (1984). [Google Scholar]
  19. L. Sabbatucci and F. Salvat, Radiat. Phys. Chem. 121, 122 (2016). [NASA ADS] [CrossRef] [Google Scholar]
  20. P. Jonnard and C. Bonnelle, X-Ray Spectrom. 40, 12 (2011). [Google Scholar]
  21. C. M. MacRae, A. E. Hughes, J. S. Laird, A. M. Glenn, N. C. Wilson, A. Torpy, M. A. Gibson, X. Zhou, N. Birbilis, and G. E. Thompson, Microsc. Microanal. 24, 325 (2018). [Google Scholar]

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.