EPJ Web of Conferences

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Preface 00001

Xavier Llovet, Bjørn E. Sørensen, Hans Dijkstra, Silvia Richter and Enrico Langer

Published online: 29 January 2026

DOI: https://doi.org/10.1051/epjconf/202634900001

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Nanoscale chemical and structural investigation of Mg-doped GaN nanowires using EDS and WDS on SEM 01001

Michael Abratis, Eric Robin and Ralf Terborg

Published online: 29 January 2026

DOI: https://doi.org/10.1051/epjconf/202634901001

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Characterisation and Validation of Submicron Structures in a Fe–Al–Nb Alloy Using Inverse Modelling of the P_N Method for EPMA 01002

Gaurav Achuda, Tamme Claus, Manuel Torrilhon and Silvia Richter

Published online: 29 January 2026

DOI: https://doi.org/10.1051/epjconf/202634901002

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Multi-methods approach for characterizing lithium-ion batteries aged to induce lithium plating 01003

Judith Blau, Kathrin Geiger, Lucas Schon, Christian Weisenberger, Ute Golla-Schindler and Gerhard Schneider

Published online: 29 January 2026

DOI: https://doi.org/10.1051/epjconf/202634901003

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EDS with Low-Voltage SEM: Possibilities and limitations of lithium detection and quantification 01004

Ute Golla-Schindler and Gerhard Schneider

Published online: 29 January 2026

DOI: https://doi.org/10.1051/epjconf/202634901004

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Study of Nitrogen Diffusion in Aluminum Containing Plasma-Nitrided Air-Hardening Medium Manganese Steels 01005

Nelli Gorin, Can S. Akkus, Alexander Gramlich and Silvia Richter

Published online: 29 January 2026

DOI: https://doi.org/10.1051/epjconf/202634901005

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Anisotropic soft X-ray emission spectroscopy study of the valence electron state of Lu(Al,T)B₄ (T= Cr, Mn, Fe, Mo) exhibiting two-dimensional B-layers 01006

Yuki Hada, Yuda Hatakeyama, Yohei K. Sato, Masami Terauchi, Kaoru Kouzu and Shigeru Okada

Published online: 29 January 2026

DOI: https://doi.org/10.1051/epjconf/202634901006

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Water content and iron oxidation state analysis of silicate glass using the electron probe 01007

Ery Hughes, Ben Buse, Stuart Kearns, Geoff Kilgour and Jon Blundy

Published online: 29 January 2026

DOI: https://doi.org/10.1051/epjconf/202634901007

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Spectroscopy, electronic structure and quantification attempt in the spectral range of the Li Kα emission band 01008

Philippe Jonnard

Published online: 29 January 2026

DOI: https://doi.org/10.1051/epjconf/202634901008

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Nanomineralogy of planetary materials 01009

Martin Lee

Published online: 29 January 2026

DOI: https://doi.org/10.1051/epjconf/202634901009

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Soft X-ray emission of nickel silicides and nickel aluminides 01010

Xavier Llovet, Aurélien Moy, Jordi Ibáñez-Insa and Philippe Jonnard

Published online: 29 January 2026

DOI: https://doi.org/10.1051/epjconf/202634901010

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Development and application of soft X-ray spectroscopy and cathodoluminescence to minerals 01011

Colin M. MacRae, Nicholas C. Wilson, Aaron Torpy, Matthew A. Glenn, Alan G. Salek, Zsanett Pintér, Andrew G. Tomkins and Dougal G. McCulloch

Published online: 29 January 2026

DOI: https://doi.org/10.1051/epjconf/202634901011

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Wavelength-Dispersive Micro X-Ray Fluorescence (WDμXRF) Analysis with the microprobe 01012

Jörg Nissen and Dirk Berger

Published online: 29 January 2026

DOI: https://doi.org/10.1051/epjconf/202634901012

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Using EBSD analysis for exploring the recrystallization behavior of hot-rolled Mg-Gd alloy 01013

Boualem Rai, François Brisset, Thierry Baudin, Ismail Bencherifa and Hiba Azzeddine

Published online: 29 January 2026

DOI: https://doi.org/10.1051/epjconf/202634901013

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Development of correlated FIB-ToF-SIMS and SEM-AM methods for the search for, and characterisation of, enriched uranium particles 01014

William Rickard, Xiao Sun and Matvei Aleshin

Published online: 29 January 2026

DOI: https://doi.org/10.1051/epjconf/202634901014

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Getting your EBSD data right, combing optical microscopy and optical simulations from EBSD orientation data in MTEX 01015

Bjørn Eske Sørensen, Ralf Hielscher, David Mainprice, Trond Slagstad, Eivind André and Flatås Østnes

Published online: 29 January 2026

DOI: https://doi.org/10.1051/epjconf/202634901015

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Challenges in measuring low concentration of overlapping elements with EDS and the need for verification with secondary standard composition 01016

Lucia Spasevski, Philippe T. Pinard, John Qing Zhang and Simon Burgess

Published online: 29 January 2026

DOI: https://doi.org/10.1051/epjconf/202634901016

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Sensitive boron detection with a table-top wavelength dispersive spectrometer 01017

Valentin Stoytschew, Christoph Braig, Thomas Krist, Jürgen Probst and Christian Seifert

Published online: 29 January 2026

DOI: https://doi.org/10.1051/epjconf/202634901017

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A new approach for material classification based on quantitative analysis 01018

John Zhang, Peter Statham, Anthony Hyde and Philippe Pinard

Published online: 29 January 2026

DOI: https://doi.org/10.1051/epjconf/202634901018

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