| Issue |
EPJ Web Conf.
Volume 349, 2026
18th European Workshop on Modern Developments and Applications in Microbeam Analysis (EMAS 2025)
|
|
|---|---|---|
| Article Number | 01010 | |
| Number of page(s) | 9 | |
| DOI | https://doi.org/10.1051/epjconf/202634901010 | |
| Published online | 29 January 2026 | |
https://doi.org/10.1051/epjconf/202634901010
Soft X-ray emission of nickel silicides and nickel aluminides
1 Centres Científics i Tecnològics, Universitat de Barcelona. Lluís Solé i Sabarís, 1-3, 08028 Barcelona, Spain
2 Gatan, Inc. 5794 W Las Positas Blvd, Pleasanton CA 94588, USA
3 Dept. of Geoscience, University of Wisconsin-Madison. 1215 West Dayton Street, Madison WI 53706-1692, USA
4 Geosciences Barcelona (GEO3BCN, CSIC). Lluís Solé i Sabarís, s/n. 08028 Barcelona, Spain
5 Sorbonne Université, Faculté des Sciences et Ingénierie. UMR CNRS. 4 place Jussieu, 75252 Paris, France
* Corresponding author: This email address is being protected from spambots. You need JavaScript enabled to view it.
Published online: 29 January 2026
Measurements are presented of the Si and Al L X-ray emission bands of Ni silicides (Ni31Si12 and Ni2Si) and Ni aluminides (Ni2Al3 and NiAl3). The spectra, obtained with a soft X-ray spectrometer and electron beam excitation, reflect the distribution of Si and Al s- and d-states in the valence band. The experimental spectra are compared with X-ray emission spectra calculated from the local and partial densities of states obtained with density functional theory.
© The Authors, published by EDP Sciences, 2026
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