Open Access
| Issue |
EPJ Web Conf.
Volume 349, 2026
18th European Workshop on Modern Developments and Applications in Microbeam Analysis (EMAS 2025)
|
|
|---|---|---|
| Article Number | 01010 | |
| Number of page(s) | 9 | |
| DOI | https://doi.org/10.1051/epjconf/202634901010 | |
| Published online | 29 January 2026 | |
- L. Miglio, F. d'Heurle. Silicides: Fundamentals and Applications (World Scientific, Singapore, 2000) [Google Scholar]
- S. Sampath, V.P. Ravi, S. Sundararajan. An overview on synthesis, processing and applications of nickel aluminides: from fundamentals to current prospects. Crystals 13, 435 (2023) https://doi.org/10.3390/cryst13030435 [Google Scholar]
- D.J. Fabian. Soft X-ray band spectra. (Academic Press, London, 1968) [Google Scholar]
- M. Terauchi, Y. Yamamoto, M.D. Tanaka. Development of a sub-eV resolution soft-X-ray spectrometer for a transmission microscope. J. Electron Microsc. 50, 101 (2001) https://doi.org/10.1093/jmicro/50.2.101 [Google Scholar]
- P.J.W. Weijs, G. Wiech, W. Zahorowski, W. Speiep, J.B. Goedkoop, M. Czyzyk, J.F. van Acker, E. van Leuken, R.A. de Groot, G. van der Laan, D. D. Sarma, L. Kumar, K. H. J. Buschow, J. C. Fuggle. X-ray emission and absorption studies of silicides in relation to their electronic structure. Phys. Scr. 41, 629 (1990) https://doi.org/10.1088/0031-8949/41/4/056 [Google Scholar]
- H. Nakamura, M. Iwami, M. Hirai, M. Kusaka, F. Akao, H. Watabe. Valence-band electronic structure of NiSi2 and CoSi2. Evidence of the Si s electronic state at the Fermi edge. Phys. Rev. B 41, 12092 (1990) https://doi.org/10.1103/PhysRevB.41.12092 [Google Scholar]
- H. Nakamura, M. Hirai, M. Kusaka, M. Iwami, H. Watabe. Soft X-ray spectroscopic analysis of Ni-Silicides. J. Phys. Soc. Jap. 61, 616 (1992) https://doi.org/10.1143/JPSJ.61.616 [Google Scholar]
- P.J.W. Weijs, H.V. Leuken, R.A. Groot, J.C. Fuggle, S. Reiter, G. Wiech, K.H.J. Buschow. X-ray-emission studies of chemical bonding in transition-metal silicides. Phys. Rev. B 44, 8195 (1991) https://doi.org/10.1103/PhysRevB.44.8195 [Google Scholar]
- J.J. Jia, T.A. Callcott, W.L. O'Brien, Q.Y. Dong, J.E. Rubensson, D. R. Mueller, D.L. Ederer, and J.E. Rowe. Local partial densities of states in Ni and Co silicides studied by soft X-ray emission spectroscopy. Phys. Rev. B 43, 4863 (1991) https://doi.org/10.1103/PhysRevB.43.4863 [Google Scholar]
- J.J. Jia. Bonding in transition-metal silicides studied via soft-x-ray-emission spectroscopy. PhD diss., University of Tennessee (1991) https://trace.tennessee.edu/utk_graddiss/11140 [Google Scholar]
- E.Z. Kurmaev, V.V. Fedorenko, S.N. Shamin and A.V. Postnikov. Small-spot X-ray emission spectroscopy and its application for study of electronic structure and chemical bonding in solids. Phys. Scr. T41, 288 (1992) https://doi.org/10.1088/0031-8949/1992/T41/052 [Google Scholar]
- S. Yamauchi, S. Kawamoto, M. Hirai, M. Kusaka, M. Iwami, H. Nakamura, H. Ohshima, T. Hattori. Valence-band density of states of near-noble-metal (Ni, Pd, Pt) monosilicides by using soft-x-ray-emission spectroscopy. Phys. Rev. B 50, 11564 (1994) https://doi.org/10.1103/PhysRevB.50.11564 [Google Scholar]
- A. Kinoshita, M. Hirai, M. Kusaka, M. Iwami. Si L23 soft X-ray emission spectra by quantitative analyis of silicides/Si system: simulation and experiment. J. Surf. Anal. 5, 86 (1999). [Google Scholar]
- N.S. Pereslavtseva, S.I. Kurganskii. Electronic structure and spectral properties of nickel disilicide films. Phys. Sol. Stat. 41, 1906 (1999) https://doi.org/10.1134/1.1131124 [Google Scholar]
- N.S. Pereslavtseva, S.I. Kurganskii. Theoretical photoemission and X-ray emission spectra of nickel and cobalt disilicide films. J. Electron. Spectros. Relat. Phenom. 114-116, 549 (2001) https://doi.org/10.1016/S0368-2048(00)00345-5 [Google Scholar]
- I. Jarrige, N. Capron, P. Jonnard, Electronic structure of Ni and Mo silicides investigated by X-ray emission spectroscopy and density functional theory. Phys. Rev. B 79, 035117 (2009) https://doi.org/10.1103/PhysRevB.79.035117 [Google Scholar]
- G. Achuda, H. Löchel, J. Probst, A. Erko, C. Seifert, T. Krist, S. Richter. Investigating the soft X-ray emission spectra of nickel silicides in EPMA. EMAS-2023 Book of Tutorial and Abstracts, p. 288 (EMAS, Zürich, 2023). ISBN 978 90 8277 6961 [Google Scholar]
- J.R. Cuthill, A.J. McAlister, M.L. Williams. Soft X-ray spectroscopy of alloys: TiNi and the Ni-Al System. J.Appl.Phys. 39, 2204 (1968) https://doi.org/10.1063/1.1656528 [Google Scholar]
- K. Ichikawa. The soft X-ray emission spectra of the aluminium transition metal alloys. J. Phys. Soc. Jap. 37, 377 (1974) https://doi.org/10.1143/JPSJ.37.377 [Google Scholar]
- S.B. Maslenkov, A.I. Kozlenkov, S.A. Filln, A.I. Shulg. Soft X-ray emission spectra from some Ni-A1 alloys. Phys. Stat. Sol. (b) 123, 605 (1984) https://doi.org/10.1002/pssb.2221230224 [Google Scholar]
- X. Llovet, P.T. Pinard, E. Heikinheimo, S. Louhenkilpi, S. Richter, Electron Probe Microanalysis of Ni Silicides Using Ni-L X-ray lines, Microsc. Microanal. 22, 1233 (2016) https://doi.org/10.1017/S1431927616011831 [Google Scholar]
- J.L. Pouchou, F. Pichoir. Quantitative analysis of homogeneous or stratified microvolumes applying the model "PAP." In: K.F.J Heinrich, D.E. Newbury, editors. Electron Probe Quantitation, p. 31–75 (Springer, New York, 1991) [Google Scholar]
- D. Borivent, B. Billia, J. Paret. Anomalous growth of Ni3Si2 in bulk Ni/Si interdiffusion. J. Appl. Phys. 104, 013523 (2008) https://doi.org/10.1063/L2946721 [Google Scholar]
- D. Connétable, O. Thomas. Olivier First-principles study of nickel-silicides ordered phases. J. Alloys Compd. 509 2639 https://doi.org/10.1016/j.jallcom.2010.10.118 [Google Scholar]
- C. Li, Z. Yuan, R. Guo, W. Xuan, Z. Ren, Y. Zhong, X. Li, H. Wang, Q. Wang. Reaction diffusion in Ni-Al diffusion couples in steady magnetic fields. J. Alloy. Compd. 641, 7 (2015) https://doi.org/10.1016/i.iallcom.2015.04.061 [Google Scholar]
- T. Imazono, M. Koike, T. Kawachi, N. Hasegawa, M. Koeda, T. Nagano, H. Sasai, Y. Oue, Z. Yonezawa, S. Kuramoto, M. Terauchi, H. Takahashi, N. Handa, T. Murano, K. Sano. Laminar and blazed type holographic gratings for a versatile soft x-ray spectrograph attached to an electron microscope and their evaluation in the 50-200 eV range. Apl. Opt. 51, 2351 (2012) https://doi.org/10.1364/AO.51.002351 [Google Scholar]
- P. Blaha, K. Schwarz, F. Tran, R. Laskowski, G.K.H. Madsen, L.D. Marks, WIEN2k: An APW+lo program for calculating the properties of solids. J. Chem. Phys. 152, 074101 (2020) https://doi.org/10.1063/L5143061 [Google Scholar]
- J.L. Campbell, T. Papp, Widths of the atomic K-N7 levels. Atom. Data Nucl. Data Tab. 77, 1 (2001) https://doi.org/10.1006/adnd.2000.0848 [Google Scholar]
- E.P. Domashevskaya, Y.A. Yurakov. Specific features of electron structures of some thin film d-silicides. J. Electron Spectrosc. Relat. Phenom. 96, 195 (1998) https://doi.org/10.1016/S0368-2048(98)00236-9 [Google Scholar]
- N. Ohtsu, M. Oku, T. Shishido, K. Wagatsuma. X-ray photoelectron spectroscopic studies on phase identification and quantification of nickel aluminides. Appl. Surf. Sci. 253, 8713 (2007) https://doi.org/10.1016/j.apsusc.2007.04.049 [Google Scholar]
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.

