Open Access
Issue
EPJ Web Conf.
Volume 349, 2026
18th European Workshop on Modern Developments and Applications in Microbeam Analysis (EMAS 2025)
Article Number 01002
Number of page(s) 13
DOI https://doi.org/10.1051/epjconf/202634901002
Published online 29 January 2026
  1. R.H. Packwood, J.D. Brown, A Gaussian expression to describe ϕ(ρz) curves for quantitative electron probe microanalysis, X-Ray Spectrometry 10, 138 (1981). 10.1002/xrs.1300100311 [Google Scholar]
  2. J.L. Pouchou, F. Pichoir, in Electron Probe Quantitation, edited by K.F.J. Heinrich, D.E. Newbury (Springer US, Boston, MA, 1991), pp. 31–75, ISBN 978-1-4899-2617-3 [Google Scholar]
  3. J.A. Riveros, G.E. Castellano, J.C. Trincavelli, Comparison of Φ (ρz) Curve Models in EPMA, in Electron Microbeam Analysis, edited by A. Boekestein, M.K. Pavicevic (Springer Vienna, Vienna, 1992), pp. 99–105, ISBN 978-3-7091-6679-6, ISSN 0076-8642 [Google Scholar]
  4. S. Richter, G. Achuda, P.T. Pinard, T. Claus, M. Torrilhon, Inverse Modeling of Heterogeneous Structures in Electron Probe Microanalysis, Microscopy and Microanalysis (2024). 10.1093/mam/ozae066 [Google Scholar]
  5. T. Claus, J. Bünger, M. Torrilhon, A Novel Reconstruction Method to Increase Spatial Resolution in Electron Probe Microanalysis, Mathematical and Computational Applications 26, 51 (2021). 10.3390/mca26030051 [Google Scholar]
  6. T. Claus, G. Achuda, S. Richter, M. Torrilhon, Subscale inversion of X-ray emission in electron probe microanalysis based on deterministic transport equations, IOP Conference Series: Materials Science and Engineering 1324, 012005 (2025). 10.1088/1757-899x/1324/1/012005 [Google Scholar]
  7. H.W. Wagner, W.S.M. Werner, H. Störi, L.M. Richardson, Electron probe microanal-ysis inverse modeling, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 184, 450 (2001). 10.1016/s0168-583x(01)00773-x [Google Scholar]
  8. Y. Yuan, H. Demers, N. Brodusch, X. Wang, R. Gauvin, Inverse modeling for quantitative X-ray microanalysis applied to 2D heterogeneous materials, Ultramicroscopy 219, 113117 (2020). 10.1016/j.ultramic.2020.113117 [Google Scholar]
  9. F. Stein, C. He, O. Prymak, S. Voß, I. Wossack, Phase equilibria in the Fe-Al-Nb system: Solidification behaviour, liquidus surface and isothermal sections, Intermetallics 59, 43 (2015). 10.1016/j.intermet.2014.12.008 [Google Scholar]
  10. J. Bünger, Ph.D. thesis, RWTH Aachen University (2021) [Google Scholar]
  11. L. Zheng-Ming, A. Brahme, An overview of the transport theory of charged particles, Radiation Physics and Chemistry 41, 673 (1993). 10.1016/0969-806x(93)90318-o [Google Scholar]
  12. J. Bünger, S. Richter, M. Torrilhon, A Model for Characteristic X-Ray Emission in Electron Probe Microanalysis Based on the (Filtered) Spherical Harmonic (PN) Method for Electron Transport, Microscopy and Microanalysis 28, 454 (2022). 10.1017/s1431927622000083 [Google Scholar]
  13. F. Salvat, PENELOPE 2018: A code system for Monte Carlo simulation of electron and photon transport: Workshop Proceedings, Barcelona, Spain, 28 January - 1 February 2019 (OECD, 2019), ISBN 9789264489950 [Google Scholar]
  14. P. K Mogensen, A. N Riseth, Optim: A mathematical optimization package for Julia, Journal of Open Source Software 3, 615 (2018). 10.21105/joss.00615 [Google Scholar]
  15. U. Naumann, The Art of Differentiating Computer Programs: An Introduction to Algorithmic Differentiation (Society for Industrial and Applied Mathematics, 2011), ISBN 9781611972078 [Google Scholar]
  16. T. Claus, G. Achuda, J. Bünger, S. Richter, M. Torrilhon, An Adjoint Method for High-Resolution EPMA Based on the Spherical Harmonics (PN) Model of Electron Transport, Journal of Computational and Theoretical Transport 53, 1 (2024). 10.1080/23324309.2024.2303508 [Google Scholar]
  17. M. Innes, A. Edelman, K. Fischer, C. Rackauckas, E. Saba, V.B. Shah, W. Tebbutt, A Differentiable Programming System to Bridge Machine Learning and Scientific Computing (2019). 10.48550/ARXIV.1907.07587 [Google Scholar]
  18. K. Kanaya, S. Ono, Interaction of Electron Beam with the Target in Scanning Electron Microscope, Scanning Electron Microscopy 1982, 69 (1982). [Google Scholar]
  19. I. Barkshire, P. Karduck, W.P. Rehbach, S. Richter, High-Spatial-Resolution Low-Energy Electron Beam X-Ray Microanalysis, Microchimica Acta 132, 113 (2000). 10.1007/s006040050052 [Google Scholar]
  20. F. Salvat, M.J. Berger, A. Jablonski, I.K. Bronic, J. Mitroy, C.J. Powell, L. Sanche, ICRU Report 77, International Commission on Radiation Units & Measurements, (Bethesda, MD) (2007) [Google Scholar]
  21. S. Duane, A.F. Bielajew, D.W.O. Rogers, ICRU Report 77, International Commission on Radiation Units and Measurements, Bethesda, MD (United States) (1984) [Google Scholar]

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