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Cited article:

A Low-Power and In Situ Annealing Technique for the Recovery of Active Devices After Proton Irradiation

Laurent A. Francis, Amor Sedki, Nicolas André, Valéria Kilchytska, Pierre Gérard, Zeeshan Ali, Florin Udrea, Denis Flandre

EPJ Web Conf., 170 (2018) 01006

Published online: 2018-01-10

DOI: https://doi.org/10.1051/epjconf/201817001006

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