Lab-on-chips based testing methods to investigate the mechanical behaviour of thin films

P. Carbonnelle; S. Ryelandt; A. Boé; M. Coulombier; A. Zulfiqar; U. Bhaskar; J.P. Raskin; T. Pardoen

doi:10.1051/epjconf/20100626001

All issues

Volume 6 (2010)

EPJ Web of Conferences, 6 (2010) 26001

Abstract

Open Access

Issue		EPJ Web of Conferences Volume 6, 2010 ICEM 14 – 14^th International Conference on Experimental Mechanics


Article Number		26001
Number of page(s)		1
Section		Thin Films and Coatings
DOI		https://doi.org/10.1051/epjconf/20100626001
Published online		10 June 2010

EPJ Web of Conferences 6, 26001 (2010)
https://doi.org/10.1051/epjconf/20100626001

Lab-on-chips based testing methods to investigate the mechanical behaviour of thin films

P. Carbonnelle¹^,2, S. Ryelandt³, A. Boé²^,3, M. Coulombier³, A. Zulfiqar², U. Bhaskar², J.P. Raskin² and T. Pardoen³

¹ MEMS Instruments, 1348 Louvain-la-Neuve, Belgium
² Electrical Engineering, Université catholique de Louvain, 1348 Louvain-la-Neuve, Belgium
³ Institute of Mechanics, Materials and Civil engineering, Université catholique de Louvain, 1348 Louvain-la-Neuve, Belgium

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