Issue |
EPJ Web Conf.
Volume 174, 2018
4th International Conference on Micro Pattern Gaseous Detectors (MPGD 2015)
|
|
---|---|---|
Article Number | 03006 | |
Number of page(s) | 3 | |
Section | Production techniques | |
DOI | https://doi.org/10.1051/epjconf/201817403006 | |
Published online | 21 February 2018 |
https://doi.org/10.1051/epjconf/201817403006
Investigation of the microstructure of Thick-GEMs with single photo-electrons
1
Wigner RCP, Budapest
2
INFN Trieste
a e-mail: hamar.gergo@wigner.mta.hu
Published online: 21 February 2018
Novel Cherenkov detector upgrades favour GEM and ThickGEM based MPGD systems. These detectors have reduced ion backflow, fast signal formation, high gain, and could suppress the MIP signals as well. Their common drawbacks are the inefficiencies of photo-electron collection fromthe top of the ThickGEM and the local variation of multiplication due to the special geometry.
The developed high resolution scanner using focused UV light gave the possibility to study single photo-electron response of MPGDs in the sub-millimeter scale. Revealing the microstructure of photo-efficiency and local gain provides a new tool to quantitatively compare different ThickGEM geometries and field-configurations, and thus optimize the detector parameters.
The presentation will focus on the key elements of the scanning system; and on the microstructure evolution of different ThickGEM configurations.
© The Authors, published by EDP Sciences, 2018
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (http://creativecommons.org/licenses/by/4.0/).
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.