| Issue |
EPJ Web Conf.
Volume 309, 2024
EOS Annual Meeting (EOSAM 2024)
|
|
|---|---|---|
| Article Number | 02014 | |
| Number of page(s) | 2 | |
| Section | Topical Meeting (TOM) 2- Frontiers in Optical Metrology | |
| DOI | https://doi.org/10.1051/epjconf/202430902014 | |
| Published online | 31 October 2024 | |
https://doi.org/10.1051/epjconf/202430902014
Microsphere-assistance in microscopic and confocal imaging
Measurement Technology Group, Faculty of Electrical Engineering and Computer Science, University of Kassel, Wilhelmshöher Allee 71, 34121 Kassel, Germany
* e-mail: lucie.hueser@uni-kassel.de
Published online: 31 October 2024
Topographical as well as microscopic imaging of nanoscale surfaces plays a pivotal role across various disciplines. Nevertheless, achieving fast, label-free, and accurate characterization of laterally expanded structures below the diffraction limit remains challenging. Recent studies highlight the use of microsphere assistance for resolution improvement. Confocal microscopy, augmented by microspheres, enables the imaging of small structures that were previously inaccessible. This is experimentally compared with microsphere-assisted microscopy (MAM) to underline the decisive role of the confocal effect.
© The Authors, published by EDP Sciences, 2024
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