Open Access
Issue
EPJ Web Conf.
Volume 133, 2017
International Conference on Semiconductor Nanostructures for Optoelectronics and Biosensors (IC SeNOB 2016)
Article Number 02006
Number of page(s) 7
Section Characterisation of nanostructures
DOI https://doi.org/10.1051/epjconf/201713302006
Published online 15 December 2016
  1. V.A. Oksenenko, L.N. Trofimova, Yu.N. Petrov, Y.V. Kudryavtsev, J. Dubowik, Y.P. Lee, Journal of Applied Physics 99, 063902 (2009) [CrossRef]
  2. A. Sugihara, K. Suzuki, S. Mizukami, T. Miyazaki, J. Phys. D: Appl. Phys. 48, 164009 (2015) [CrossRef]
  3. S. Zhou, K. Potzger, G. Zhang, A. Mücklich, F. Eichhorn, N. Schell, R. Grötzschel, B. Schmidt, W. Skorupa, M. Helm, J. Fassbender, Phys. Rev. B 75 085203 (2007) [CrossRef]
  4. R. Fetzer et al, J. Phys. D: Appl. Phys. 48, 164002 (2015) [CrossRef]
  5. S. Mizukami, A. Serga, J. Phys. D: Appl. Phys. 48, 160301 (2015) [CrossRef]
  6. R. Kainuma, K. Oikawa, W. Ito, Y. Sutou, T. Kanomata, K. Ishida, J. Mater. Chem. 18, 1873–1842 (2008) [CrossRef]
  7. I. Dubenko, A.K. Pathak, S. Stadler, N. Ali, Phys. Rev. B 80, 092408 (2009) [CrossRef]
  8. H.C. Xuan, F.H. Chen, P.D. Han, D.H. Wang, Y.W. Du, Intermetallics 47, 31-35 (2014) [CrossRef]
  9. D. B. Chrisey, G.K. Hubler, Pulsed Laser Deposition of Thin Films, Wiley & Sons, New York, 1994
  10. S. Rai, M.K. Tiwari, G.S. Lodha, M.H. Hodi, M.K. Chattopadhyay, S. Majumdar, S. Gardelis, Z. Viskadourakis, J. Giapintzakis, R.V. Nandedkar, S.B. Roy, P. Chaddah, Phys. Review B 73, 0354017 (2006)
  11. J. T. Cheung and H. Sankur, CRC Crit. Rev. Solid State Matter. Sci. 15, 63 (1988) [CrossRef]
  12. W. Maziarz, Solid State Phenomena 186, 251-254 (2012) [CrossRef]
  13. T. Krenke, M. Acet, E.F. Wassermann, Phys. Rev. B 73, 174413 (2006) [CrossRef]
  14. Ch.M. Li, H.B. Luo, Q.M. Hu, R. Yang, B. Johansson, L. Vitos, Phys. Rev. B 86, 214205 (2012) [CrossRef]

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.