Open Access
EPJ Web Conf.
Volume 170, 2018
Article Number 01014
Number of page(s) 5
Section Fundamental physics
Published online 10 January 2018
  1. V.V. Samedov, “Induced charge fluctuations in hemispherical semiconductor detectors”, X-Ray Spectrometry, 2017; to be published.
  2. V.V. Samedov, “Fluctuations in the processes of charge induction in ionization-type detectors”, X-Ray Spectrometry, vol. 44, pp. 183–185, 2015. [CrossRef]
  3. H. Spieler, Semiconductor detector systems, Oxford University Press, 2005. [CrossRef]
  4. G. Gasper, Basic hypergeometric series, Cambridge University Press, 2004. [CrossRef]
  5. Handbook of Mathematical Functions, Eds. M. Abramowitz and I. A. Stegun, National Bureau of Standards Applied Mathematics Series 55, Washington, D.C., 1972.
  6. V.V. Samedov, “The Basics of Experimental Determination of the Fano Factor in Intrinsic Semiconductors”, IEEE Catalog Number CFP1324I-CDR, DOI 978-1-4799-1047-2/13/$31.00, 2013
  7. V.V. Samedov, “Theoretical approach to the energy resolution of semiconductor detectors”, Conference Record of the 2016 IEEE Nuclear Science Symposium and Medical Imaging Conference, Paper ID R09-40, 2016.
  8. V.V. Samedov, “Theoretical consideration of the energy resolution in planar HPGE detectors for low energy X-rays”, ANIMMA 2015, Article number 7465586, DOI: 0.1109/ANIMMA.2015.7465586, 2015.

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