EPJ Web Conf.
Volume 215, 2019EOS Optical Technologies
|Number of page(s)||2|
|Section||Joint Session (EOS MOS and SPIE OM) – Measurement of Optical Components I: Asphere and Freeform Measurement, EOS Papers only|
|Published online||10 September 2019|
- Y. Li, J. Wang, Q. Xu and Y. Guo, Journal of the European Optical Society Rapid Publications, (2011) [Google Scholar]
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