Open Access
Issue |
EPJ Web Conf.
Volume 215, 2019
EOS Optical Technologies
|
|
---|---|---|
Article Number | 08002 | |
Number of page(s) | 2 | |
Section | Joint Session (EOS MOS and SPIE OM) – Measurement of Optical Components I: Asphere and Freeform Measurement, EOS Papers only | |
DOI | https://doi.org/10.1051/epjconf/201921508002 | |
Published online | 10 September 2019 |
- S. Scheiding, C. Damm, W. Holota et al., Proc. SPIE 7739, 773908 (2010) [CrossRef] [Google Scholar]
- M. Beier, J. Hartung, T. Peschel et al., Appl. Optics 54, 3530 (2015) [CrossRef] [Google Scholar]
- Patent 2018 F61223, Halterung zur Fixierung und Referenzierung von mit einer Messvorrichtung an mehreren, nicht in einer gemeinsamen Ebene angeordneten Oberflächen in einer Einspannung zu vermessenden Bauteilen [Google Scholar]
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.